Conferences / Journals

  1. Jose Lima, Yuri Cho, Julie Muccini, Edward Kim, Alan Gallegos, Alton Sturgis, James Hu, Cathy Zhang, Nick Perlich, Sanjit Seshia, Maarten Lansberg, “Modified Fugl Meyer Assessment in Augmented Reality,” American Academy of Neurology (AAN), 2024 [To Appear]

  2. Eric Vin, Shun Kashiwa, Matthew Rhea, Daniel Fremont, Edward Kim, Tommaso Dreossi, Shormona Ghosh, Xiangyu Yue, Alberto Sangiovanni-Vincentelli, Sanjit A. Seshia, “3D Environment Modeling for Falsification and Beyond with Scenic 3.0,” Computer Aided Verification (CAV), 2023

  3. Edward Kim, Jay Shenoy, Sebastian Junges, Daniel J Fremont, Alberto Sangiovanni-Vincentelli, Sanjit A Seshia, “Querying Labelled Data with Scenario Programs for Sim-to-Real Validation,” International Conference on Cyber-Physical Systems (ICCPS), 2022 [Best Paper Nominee]

  4. Daniel J Fremont, Edward Kim, Tommaso Dreossi, Shromona Ghosh, Xiangyu Yue, Alberto L Sangiovanni-Vincentelli, Sanjit A Seshia, “Scenic: A language for scenario specification and data generation,” Machine Learning Journal, pg. 1-45, 2022

  5. Abdus Salam Azad*, Edward Kim*, Qiancheng Wu, Kimin Lee, Ion Stoica, Pieter Abbeel, Sanjit A Seshia, “Programmatic Modeling and Generation of Real-time Strategic Soccer Environments for Reinforcement Learning,” Association for the Advancement of Artificial Intelligence (AAAI), 2022 [ * indicate equal contributions]

  6. Kesav Viswanadha, Edward Kim, Francis Indaheng, Daniel J Fremont, Sanjit A Seshia, “Parallel and Multi-objective Falsification with Scenic and VerifAI,” Runtime Verification (RV), 2021

  7. Kesav Viswanadha, Francis Indaheng, Justin Wong, Edward Kim, Ellen Kalvan, Yash Pant, Daniel Fremont, Sanjit Seshia, “Addressing the IEEE AV Test Challenge with Scenic and VerifAI,” IEEE International Conference On Artificial Intelligence Testing, vol. 1, pg. 136-142, 2021

  8. Daniel J Fremont, Edward Kim, Yash Vardhan Pant, Sanjit A Seshia, Atul Acharya, Xantha Bruso, Paul Wells, Steve Lemke, Qiang Lu, Shalin Mehta, “Formal scenario-based testing of autonomous vehicles: From simulation to the real world,” International Conference on Intelligent Transportation Systems (ITSC), 2020

  9. Edward Kim, Divya Gopinath, Corina Pasareanu, Sanjit A Seshia, “A Programmatic and Semantic Approach to Explaining and Debugging Neural Network Based Object Detectors,” Conference on Computer Vision and Pattern Recognition (2020)

  10. Tommaso Dreossi, Daniel J Fremont, Shromona Ghosh, Edward Kim, Hadi Ravanbakhsh, Marcell Vazquez-Chanlatte, Sanjit A Seshia, “VerifAI: A Toolkit for the Formal Design and Analysis of Artificial Intelligence-Based Systems,” Computer Aided Verification (CAV), 2019

  11. Sanjit A Seshia, Ankush Desai, Tommaso Dreossi, Daniel J Fremont, Shromona Ghosh, Edward Kim, Sumukh Shivakumar, Marcell Vazquez-Chanlatte, Xiangyu Yue, “Formal specification for deep neural networks,” Automated Technology for Verification and Analysis (ATVA), 2018

Workshops

  1. Edward Kim, Alberto Sangiovanni-Vincentelli, Sanjit Seshia, “Using Probabilistic Programs to Generate Sensor Data for System Testing, Training, and Validation,” Workshop on Learning from Diverse, Offline Data at the International Conference on Robotics and Automation (ICRA), 2023 [Selected for a Spotlight Talk]

  2. Edward Kim, Jay Shenoy, Sebastian Junges, Daniel Fremont, Alberto Sangiovanni-Vincentelli, Sanjit Seshia, “Querying Labelled Data with Probabilistic Programs for Sim-to-Real Validation,” Workshop on Verification of Probabilistic Programs at Computer Aided Verification (CAV) Conference, 2023

  3. Francis Indaheng, Edward Kim, Kesav Viswanadha, Jay Shenoy, Jinkyu Kim, Daniel J. Fremont, Sanjit A. Seshia, “A Scenario-Based Platform for Testing Autonomous Vehicle Behavior Prediction Models in Simulation,” Workshop on Machine Learning for Autonomous Driving at Neural Information Processing Systems (NeuriPS), 2021

  4. Edward Kim, Shromona Ghosh, Tommaso Dreossi, Daniel J. Fremont, Sanjit A. Seshia, and Alberto Sangiovanni-Vincentelli, “Evaluating Sampling Techniques for Testing Cyber-Physical Systems with Machine Learning Components,” Workshop on Monitoring and Testing of Cyber-Physical Systems Workshop at the IEEE
    International Conference on Cyber-Physical Systems (ICCPS), 2019